Pulverröntgendiffraktometrie (PXRD)
Our group possesses a Bruker D8 Advance diffractometer for crystalline samples and compounds with a well-ordered pore structure. It is equipped with a copper Kalpha X-ray source and an auto sampler. The measurement is performed in a bragg brentano geometry. The samples are prepared on a PMMA or Silicon (zero background) sample holder. Slow rotation of the sample holder during the measurement is possible. The measurement range (0.55° ≤ 2θ ≤ 80°), exposure time and step size can be adjusted.
